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Develop and implement ATPG (Automatic Test Pattern Generation) for complex SoC designs.
Perform DFT pattern generation, fault simulation, and coverage analysis.
Work closely with DFT and verification teams to improve test coverage and quality.
Debug ATPG patterns and support silicon bring-up and test activities.
Optimize test methodologies to enhance efficiency and reduce test time.
Strong hands-on experience in SoC-level ATPG and fault coverage improvement.
Proficiency in DFT tools such as Synopsys TetraMAX, Cadence Modus, or equivalent.
Good understanding of DFT architectures — scan insertion, MBIST, JTAG, boundary scan.
Familiarity with STA, synthesis, and RTL design flows.
Excellent problem-solving and debugging skills.
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